Effect of interparticle-interaction on dielectric function spectra of multilayered semiconductor nanocrystals

Abstract

In this study, the ellipsometric measurements have been performed to multilayered semiconductor nanocrystals deposited by Layer-by-Layer method. The obtained dielectric function spectra show a change related to the number of nanocrystal layers. The effects of interaction between semiconductor nanocrystal layers are found in the dielectric function spectra.