Structural Evaluation of an Iron Oxalate Complex Layer Grown on an Ultra-smooth Sapphire (0001) Surface by a Wet Method

Abstract

A crystallographic structure of an iron oxalate ultra-thin film grown on an ultra-smooth sapphire (0001) substrate was analyzed using synchrotron x-ray reflectivity and grazing incidence x-ray diffraction. The results show that the iron oxalate layer formed in crystal. In-plane diffraction measurements show the structure of the layer is random, and out-of-plane grazing incidence diffraction measurements show that the iron oxalate structure of the layer is affected by the step structure of sapphire surface, assumed to bond to the step edge.