Scanning SQUID Microscopy Observation of Grain Boundary Junction in Tri-Phase Epitaxy NdBa2Cu3O7-δ Thin Film

Shunichi Arisawa; Kyungsung Yun; Kazuya Mochiduki; Ienari Iguchi; Takeshi Hatano; Huabing Wang; Akira Ishii

doi:10.14723/tmrsj.35.195

Scanning SQUID Microscopy Observation of Grain Boundary Junction in Tri-Phase Epitaxy NdBa₂Cu₃O_7-δ Thin Film

Shunichi Arisawa, Kyungsung Yun, Kazuya Mochiduki, Ienari Iguchi, Takeshi Hatano, Huabing Wang, Akira Ishii

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Keywords: superconductor, scanning probe microscopy, thin film, grain boundary

JOURNAL FREE ACCESS

2010 Volume 35 Issue 1 Pages 195-196

DOI https://doi.org/10.14723/tmrsj.35.195

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Abstract

High quality grain boundary junction of NdBa₂Cu₃O_7-δ (NBCO) thin films was fabricated by Tri-Phase Epitaxy technique. Current flows in the film with the junction and artificial defects were investigated by Scanning SQUID microscopy. Magnetic signals generated by the current in the sample were clearly observed. Quantized magnetic vortices close to the grain boundary were also studied.

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