Transactions of the Materials Research Society of Japan
Online ISSN : 2188-1650
Print ISSN : 1382-3469
ISSN-L : 1382-3469
Regular Papers
Oxide-ion conduction and dielectric relaxation in the fluorite-type Zr0.8Ln0.2O1.9 (Ln = Nd, Sm, Eu, Gd, Dy, Ho, Er, Tm, Yb, Lu) system.
Jun-ichi KawamotoYuhji YagiJun SatakeToshio TakayamaHiroshi Yamamura
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2010 Volume 35 Issue 3 Pages 655-658

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Abstract
The electrical conductivity and dielectric properties of the Zr0.8Ln0.2O1.9 (Ln = Nd, Sm, Eu, Gd, Dy, Ho, Er, Tm, Yb, Lu) system which have a cubic fluorite-type structure were investigated in order to clarify a dynamic property of oxygen vacancy in oxide-ion conductors. The frequency dependences of dielectric constants (εr') were successfully explained by the superposition of Debye-type polarizations and electrolyte-electrode interfacial polarizations. The ac conductivity (σac) agreed with the calculated values using the dielectric parameters. It was found that the compositional dependence of dielectric properties was similar to that of σac.
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© 2010 The Materials Research Society of Japan
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