Structure of Br Ions in Br-Ion-Implanted Silica Glass

K. Fukumi; A. Chayahara; H. Kageyama; N. Kitamura; J. Nishii; K. Handa; J. Ide; K. Kadono

doi:10.14723/tmrsj.35.769

Regular Papers

Structure of Br Ions in Br-Ion-Implanted Silica Glass

K. Fukumi, A. Chayahara, H. Kageyama, N. Kitamura, J. Nishii, K. Handa, J. Ide, K. Kadono

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Keywords: Structure, Br ions, Silica Glass, X-ray absorption

JOURNAL FREE ACCESS

2010 Volume 35 Issue 4 Pages 769-772

DOI https://doi.org/10.14723/tmrsj.35.769

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Abstract

Structure of implanted Br ions has been studied in 2.4MeV 6x10¹⁶ Br ions cm^-2-implanted silica glass by X-ray absorption spectroscopy. It was found that most of implanted Br atoms form Br-Si bonds in as-implanted glass. Br atoms were substituted for oxygen atoms in SiO₄ tetrehedra to form SiO₃Br tetrahedra. About 60% of Br atoms formed Br₂ molecules in the glass after heating at 600℃.

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