An equation of average lifetime of the minority carriers in semiconductors from photo-electrochemical measurement

M. Muhibbullah; M. Golam Mowla Choudhury; Sharif M. Mominuzzaman; Junie Jhon M. Vequizo; Yang Kai

doi:10.14723/tmrsj.38.385

Regular Papers

An equation of average lifetime of the minority carriers in semiconductors from photo-electrochemical measurement

M. Muhibbullah, M. Golam Mowla Choudhury, Sharif M. Mominuzzaman, Junie Jhon M. Vequizo, Yang Kai

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Keywords: average lifetime, minority carrier, PEC measurement

JOURNAL FREE ACCESS

2013 Volume 38 Issue 3 Pages 385-388

DOI https://doi.org/10.14723/tmrsj.38.385

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Abstract

In a semiconductor, the average lifetime of the minority carriers is important for the applications of optoelectronic devices. Longer and shorter average lifetimes are expected for different applications. Photo-electrochemical measurement shows electrical and optical properties with some information of average lifetime of the minority carriers. An equation of the average lifetime for excited minority carriers in the semiconductors is derived from the results of photo-electrochemical measurement.

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