Probing of Electric Field Distribution and Carrier Behavior in Double-Layer Organic Light-Emitting Diodes by a Novel Microscopic Electric-Field-Induced Optical Second-Harmonic Generation Measurement system

Atsuo Sadakata; Ryota Yano; Dai Taguchi; Takaaki Manaka; Mitsumasa Iwamoto

doi:10.14723/tmrsj.39.443

Regular Papers

Probing of Electric Field Distribution and Carrier Behavior in Double-Layer Organic Light-Emitting Diodes by a Novel Microscopic Electric-Field-Induced Optical Second-Harmonic Generation Measurement system

Atsuo Sadakata, Ryota Yano, Dai Taguchi, Takaaki Manaka, Mitsumasa Iwamoto

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Keywords: organic light-emitting diodes, an electric field distribution, the distribution of interfacial accumulation charge, microscopic electric-field-induced optical second-harmonic generation measurement

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2014 Volume 39 Issue 4 Pages 443-446

DOI https://doi.org/10.14723/tmrsj.39.443

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Abstract

To analyze carrier behaviors leading to electroluminescence (EL) of double-layer organic light-emitting diodes (OLEDs), we used a novel microscopic electric-field-induced optical second-harmonic generation measurement system equipped with a radially polarized pulsed laser beam, which can probe two-dimensional electric field distributions in OLEDs. We showed a relationship between EL emission distribution and interfacial accumulated charge distribution.

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