Abstract
Thermoelectric properties of In2-xMxO3 system doped with tetravalent metal (M) ions (Si4+, Ti4+, Ge4+, Sn4+, Te4+, and Ce4+) were investigated at temperatures up to 1273 K. For the Ge-substituted system, the power factor P takes a maximum of 9.5 × 10-4 W/K2m around 1150 K and dimensionless thermoelectric figure of merit ZT shows a maximum of 0.18 at 1000 K for the x=0.025 sample, which is the solubility limit of Ge. The maximum ZT of the In1.9M0.1O3 series was about 0.13 around 1000 K for the Si4+, Ge4+ and Sn4+ doped samples. We also investigated the thermoelectric properties of the In2O3-SnO2 system doped with pentavalent Sb element to replace the expensive In2O3 to the plentiful SnO2. The Sb atom was preferentially substituted for the In-site and the thermoelectric properties do not exceed those of pure In2O3. The potential of the thermoelectric properties in the doped In2O3-SnO2 system was discussed.