Evaluation of Lattice Defects using the Positron Annihilation Lifetime Measurement (Measurement example of shot-peened samples)

Abstract

The measurement of positron annihilation lifetime has been used as an analytical technique for detecting ultrafine defects. It is also applicable to research on metal fatigue and the development of functional polymer materials since it exhibits high detection sensitivity for lattice defects of metals and free volume of polymers. We focused on the positron annihilation lifetime measurement as an analytical method for shot-peened materials, and developed desktop and portable type systems for in-line or on-site inspections. At this opportunity, we report an example of positron annihilation lifetime measurements for shotpeened samples and make a comparison with the full width of half maximum (FWHM) values of X-ray diffraction (XRD) measurements.