Proceedings of The ITE Annual Convention
Online ISSN : 2433-0930
Print ISSN : 0919-1879
32
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The Investigation of Foreign Interference Waves caused by Sporadic-E layer
Hiroshi Fujita
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CONFERENCE PROCEEDINGS FREE ACCESS

Pages 180-181

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Abstract

We develop a new automatic measurement equipment to investigate the characteristic of foreign interference waves caused by Sporadic-E layer. As the result of the investigation, we prove that foreign interference waves arrive between 0 and 20 degrees in elevation.

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© 1996 The Institute of Image Information and Television Engineers
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