Evaluation of ZnS:TbF_3 thin film EL

Abstract

A value of luminance of EL(electroluminescent) devices have not been reached to suficient at this stage. To overcome that, ZnS:TbF_3 thin films were observed using TEM and X-ray diffraction. Strcture of TbF_3 was investigated. Accordingly the following results are obtained, (1) Tb atoms or particles disturb the formation of recrystalization of ZnS film. (2) The structure of TbF_3 belongs to YF_3 type orthorhombic system.