X-ray fluoroscopy for detection of fine defects by using subtract image processing

Abstract

Highly sensitive X-ray fluoroscopy test for fine defects in ceramics is presented. Instead of conventional integral image processing on fluoroscopy test, a new type of testing with image subtraction method is proposed. By using the new testing method, in addition to reducing random noise till very low level, other components of noise in X-ray TV image can be greatly reduced because of detecting of only moving points of defects in the TV image, which can enhance the image contrast of the defects remarkably. Very high detectability more than usual film method can be obtained.