Proceedings of Symposium on Ultrasonic Electronics
Online ISSN : 2433-1910
Print ISSN : 1348-8236
P2-4 Analysis of stress-induced ferroelectric domain structure by ultrasonic atomic force microscopy(Short oral presentation for posters)
Seishiro Ide, Toshihiro Tsuji, Kazushi Yamanaka
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2005 Volume 26 Pages 219-220

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© 2005 Institute for Ultrasonic Elecronics
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