1Pa-1 Evaluation of Ultrasonic Attenuation in Oxide Thin Films by Brillouin Oscillation Using Strong Wavelength Dependence of Refractive Index in Si(Poster Session)

Kei Morita; Hirotsugu Ogi; Nobutomo Nakamura; Masahiko Hirao

doi:10.24492/use.31.0_17

Proceedings of Symposium on Ultrasonic Electronics

Online ISSN : 2433-1910
Print ISSN : 1348-8236

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1Pa-1 Evaluation of Ultrasonic Attenuation in Oxide Thin Films by Brillouin Oscillation Using Strong Wavelength Dependence of Refractive Index in Si(Poster Session)

Kei Morita, Hirotsugu Ogi, Nobutomo Nakamura, Masahiko Hirao

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JOURNAL FREE ACCESS

2010 Volume 31 Pages 17-18

DOI https://doi.org/10.24492/use.31.0_17

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