1Pa-8 Detection of Thermal Energy Loss of the photoexcited Carriers in Polycrystalline Silicon p-n Junction Interface Region by a Piezoelectric Photothermal Study(Poster Session)

Hitoshi Tamura; Atsuhiko Fukuyama; Tetsuo Ikari; Kentaro Sakai

doi:10.24492/use.31.0_31

Proceedings of Symposium on Ultrasonic Electronics

Online ISSN : 2433-1910
Print ISSN : 1348-8236

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1Pa-8 Detection of Thermal Energy Loss of the photoexcited Carriers in Polycrystalline Silicon p-n Junction Interface Region by a Piezoelectric Photothermal Study(Poster Session)

Hitoshi Tamura, Atsuhiko Fukuyama, Tetsuo Ikari, Kentaro Sakai

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JOURNAL FREE ACCESS

2010 Volume 31 Pages 31-32

DOI https://doi.org/10.24492/use.31.0_31

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