Proceedings of Symposium on Ultrasonic Electronics
Online ISSN : 2433-1910
Print ISSN : 1348-8236
3J-4 Evaluation Method of Fictive Temperature of Synthetic Silica Glasses by the Ultrasonic Microspectroscopy Technology(Measurement Techniques)
Jun-ichi KushibikiMototaka ArakawaYuji OhashiYuko MaruyamaTakanori KondoTetsuo Yoshida
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2010 Volume 31 Pages 451-452

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Abstract
We developed an evaluation method of T_F for SiO_2 glasses. We clarified that V_1 measurements are extremely useful with a resolution of T_F 0.3-0.4℃, and V_<LSAW> measurements can provide two-dimensional T_F distributions on the specimen surfaces. Glass manufacturers can evaluate T_F of fabricated glass ingots, T_F distributions, and their fabrication processes by this ultrasonic method.
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© 2010 Institute for Ultrasonic Elecronics
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