Proceedings of Symposium on Ultrasonic Electronics
Online ISSN : 2433-1910
Print ISSN : 1348-8236
1P3-13 Probe with Three Degree-of-Freedom for Test Using Longitudinal and Shear Waves(Poster Session)
Masafumi AoyanagiNaoto WakatsukiKoichi MizutaniTadashi Ebihara
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2014 Volume 35 Pages 103-104

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© 2014 Institute for Ultrasonic Elecronics
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