Proceedings of Symposium on Ultrasonic Electronics
Online ISSN : 2433-1910
Print ISSN : 1348-8236
3P2-16 Non Destructive Inspection by broadband, high sensitive flexible array probe(Poster Session)
Katsumi OhiraYuusuke TanakaDaisuke HiranoAkira SakaiYukio Ogura
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2014 Volume 35 Pages 447-448

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Abstract

BFAP has been confirmed that it has been improved as shown in Table 1 in comparison with the conventional FAP.

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© 2014 Institute for Ultrasonic Elecronics
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