2P1-4 Measurements of Ultrasonic Surface wave Velocities in Silicon Crystals and its Comparison with FE Analysis

Proceedings of Symposium on Ultrasonic Electronics

Online ISSN : 2433-1910
Print ISSN : 1348-8236

2P1-4 Measurements of Ultrasonic Surface wave Velocities in Silicon Crystals and its Comparison with FE Analysis

Hye Soo Park, Hyun-Seok Lee, Hyeon-Soo Lee, Hak-Beom Kim, Young H. Kim

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JOURNAL FREE ACCESS

2016 Volume 37 Article ID: 2P1-4

DOI https://doi.org/10.24492/use.37.0_2P1-4

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© 2016 Institute for Ultrasonic Elecronics

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