Proceedings of Symposium on Ultrasonic Electronics
Online ISSN : 2433-1910
Print ISSN : 1348-8236
1J2-3 Analysis of sound and temperature fields in ultrasonic beam induced resistance change (SOBIRCH) method aiming to failure analysis for semiconductor devices
Takuto MatsuiKousuke TatsumiTomohiro KawashimaYoshinobu MurakamiNaohiro HozumiShigeru EuraToru Matsumoto
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2018 Volume 39 Article ID: 1J2-3

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© 2018 Institute for Ultrasonic Elecronics
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