Proceedings of Symposium on Ultrasonic Electronics
Online ISSN : 2433-1910
Print ISSN : 1348-8236
2P1-5 Evaluation of SiO2 Thin Film on Piezoelectric Substrate by the Line-Focus-Beam Ultrasonic Material Characterization System
Ryota Suenaga, Masashi Suzuki, Shoji Kakio, Yuji Ohashi, Mototaka Arakawa, Jun-ichi Kushibiki
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2018 Volume 39 Article ID: 2P1-5

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© 2018 Institute for Ultrasonic Elecronics
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