Proceedings of Symposium on Ultrasonic Electronics
Online ISSN : 2433-1910
Print ISSN : 1348-8236
3P2-14 Frequency determination in nondestructive test of semiconductor devices with ultrasound heating
Takuto Matsui, Kosuke Tatsumi, Tomohiro Kawashima, Yoshinobu Murakami, Naohiro Hozumi, Toru Matsumoto
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2019 Volume 40 Article ID: 3P2-14

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