Proceedings of Symposium on Ultrasonic Electronics
Online ISSN : 2433-1910
Print ISSN : 1348-8236
2E2-3 Practical closed-crack imaging using different-voltage fundamental wave amplitude difference (DV-FAD) with improved calibration
Toshiki Yoshikawa, Yudai Yashiro, Akira Nagakubo, Yoshikazu Ohara
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2025 Volume 46 Pages 85-

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