Fast Method for Searching Image Quality Inspection Procedures

Abstract

The production of flat panel displays and image sensors has been increasing rapidly by the recent diversification of their uses. For that reason, in the defect inspection of those image devices, the automation of image inspection has proceeded. However, it was difficult to make general procedures of image processing, because there were various defects. Therefore, engineering cost increases. This paper describes a searching system for image processing procedures and parameters. In particular, we propose the fast method using the searching results for similar defects.