Reports of the Technical Conference of the Institute of Image Electronics Engineers of Japan
Online ISSN : 2758-9218
Print ISSN : 0285-3957
Reports of the 216th Technical Conference of the Institute of Image Electronics Engineers of Japan
Session ID : 04-07-06
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Spectral Analysis of Mutual Reflection and Its Application
*Asuka KISHIYAMAShoji TOMINAGA
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Abstract
The phenomenon of mutual reflection is often seen in our every day lives. When two objects are placed closely, the influence of mutual reflection can be observed between the two objects. This phenomenon causes a problem in the fields of computer vision and image processing because it changes appearance of the scene. This paper describes the spectral analysis of mutual reflection between two surfaces with perfect diffuse reflection. We model the physical phenomenon of multiple reflections of light between two surfaces. We use the spectral imaging system consisting of a multi-band camera. First, we observe the spectral reflectances with the influence of the mutual reflection, and estimate the original spectral reflectances inherent to the object surfaces. Next, we extend the radiosity algorithm to the spectral version and render images of diffuse mutual reflection based on the estimates of the inherent spectral reflectances.
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© 2005 by The Institute of Image Electronics Engineers of Japan
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