Advances in X-Ray Chemical Analysis, Japan
Online ISSN : 2758-3651
Print ISSN : 0911-7806
Review Articles
Pitfalls in PIXE Analysis - Secret to Obtain Reliable Data -
Fumitaka NISHIYAMA
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JOURNAL FREE ACCESS

2010 Volume 41 Pages 61-74

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Abstract

PIXE analysis is quite similar to X-ray fluorescence analysis and scanning electron microscope (SEM) equipped with energy dispersive X-ray analysis. However, PIXE analysis is not a commercial product, and the main difference is qualitative and quantitative data cannot be obtained without doing correct procedures. This note describes secret of experimental techniques that is not written in the academic papers.

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© 2010 The Discussion Group of X-Ray Analysis, The Japan Society for Analytical Chemistry
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