Improving the Precision of EDXRF using the Fundamental Parameter Method

Abstract

We assess the quantitative accuracy of energy dispersive X-ray fluorescence (EDXRF) analysis by measuring spectra of stainless steel using an EDXRF spectrometer combined with a modified FP method whose integral variable is transformed from wavelength, λ, to energy, E. In the present paper, E² term is included in the conventional FP method, which leads to the improvement of quantitative accuracy of EDXRF.