2021 Volume 52 Pages 69-80
In the imaging XAFS method using an X-ray CCD detector, a transmission method has been applied to heavy elements with absorption edges at relatively high energies. Although the transmission method requires the sample to be an optimal thickness, the high-energy X-rays have high transmission capability, and can be applied to relatively thick samples. In this study, we attempted to develop a fluorescence method for fast screening of transition metal elements with the low energy X-ray absorption edges and their valence distribution in the samples such as glass materials, which are difficult to make thin. In order to obtain XAFS spectra with high sensitivity and positional resolution, a direct imaging detector without a scintillator and a pinhole were used. The results were demonstrated with a highly brilliant synchrotron radiation undulator X-ray with variable incident energy.
