Individual identification method for electronic devices using differences in spectrum emissions caused by manufacturing and assembly variations
Released on J-STAGE: October 01, 2026 |
Volume 15
Issue 10
Pages 404-408
Koki Abe, Shugo Kaji, Daisuke Fujimoto, Masahiro Kinugawa, Laurent Sauvage, Jean-Luc Danger, Yuichi Hayashi