Fundamentals of Nucleation Mechanism of Electromigration in Metal Joints and Issues in Reliability
Released on J-STAGE: July 27, 2018 | The 28th JIEP Annual Meeting 7B-05
* Kimihiro Yamanaka
Highly Acceleration Test on Lead-Free Solder
Released on J-STAGE: July 17, 2014 | The 23th JIEP Annual Meeting 11C-08
* Masaru Morita, Nobuyuki Hayashi, Teru Nakanishi, Yasuhiro Yoneda
Wafer-level Three-dimensional Integration Technology using Hybrid Wafer Bonding
Released on J-STAGE: July 27, 2018 | The 27th JIEP Annual Meeting 14A-11
* Kazuyuki Hozawa
Making processes and their issues of through silicon via
Released on J-STAGE: October 02, 2009 | The 22th JIEP Annual Meeting 17C-01
* Sei-ichi Denda
Mechanism for Spontaneous Zinc Whisker Growth from an Electroplated Zinc Coating
Released on J-STAGE: July 17, 2014 | The 24th JIEP Annual Meeting 10C-01
* Alongheng Baated, Keun-Soo Kim, Katsuaki Suganuma
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