Common Data Processing System (COMPRO) has been upgraded many times, and the latest one is Version 12 (COMPRO12), which runs on Windows (7, 8, and 10). The usage of COMPRO10 has been explained as a series of lectures which started in JSA Vol. 9 (2012), No1. Therefore, in this paper, the key changes of COMPRO12 from COMPRO10 are only introduced.
Before version 12, the ISO formatted data file was only accepted by COMPRO, and data files with other format structures must be converted to ISO formatted structure by cumbersome procedures. COMPRO12 can read CSV and Excel files only by the simple conversion process. The abscissa scale shifting process is newly attached, and can compensate the shifting of energy position by charge-up. The background subtraction by active Shirley process is included, and the peak fitting process is improved. The displaying procedure of absolute Auger spectral database is enriched. The usage of data processing procedures included in COMPRO12 is displayed by the internet.
Electron probe micro analyzer is used for the composition analysis of a wide variety of materials, and its quantification is almost established as a ZAF method. The quantification of MgGe alloy, however, showed an anomalously-high total concentration (i.e. 120%) of the elements of Mg and Ge. The previous analysis of MgGe alloy was not considered to be correct according to the additional fact that the estimated concentrations of Mg increases with the accelerating voltage of the electron beam. Because the mass absorption coefficient of Ge for Mg Kα , is an essential parameter of the ZAF method, we then determined the mass absorption coefficient of Ge for Mg Kα by using measured X-ray peak intensity ratios of Ge and Mg of MgGe alloy to the standard materials (MgO and Ge). The resulting mass absorption coefficient of Ge for Mg Kα was 5561± 200 cm2⁄g which were obtained between the electron-beam accelerating voltage of 15kV ∼ 30kV. It is smaller than the previous mass absorption coefficient of 7510 cm2⁄g, which lead the anomalous quantification error. The difference of the mass absorption coefficients must be caused by the difficulty of the measurement of the mass absorption coefficient of Ge for Mg Kα, the energy of which are close to the Ge LI and LIIabsorption edges.
We report here the Auger electron spectroscopy (AES) of insulators using graphene as a conductive layer. For the AES of insulators, it is necessary to give conductivity to the insulator surfaces by coating with conducting thin membranes in general. We focused on graphene properties such as high electrical conductivity and one-atomic thickness, and applied graphene as the conductive layer. As a result, high insulating particles were measured by the AES with graphene in the first time. The single layer graphene was deposited on arbitrary substrates and behaved as an ideal conductive layer for the AES analysis.
This paper describes the core-level electronic structure of La1-xSrxMnO3 by laboratory x-ray photoelectron spectroscopy (Lab-XPS). For the first time, by Lab-XPS, we have succeeded in observing the shoulder structure in the lower binding energy side of Mn 2p3/2 core-level spectra which has been observed only in the hard x-ray photoelectron spectroscopy (HX-PES). Then Mn3+, Mn4+, and the shoulder structure on the Mn 2p3/2 are separated by a multi-peak analysis. The result of considering Mn3+ ⁄ Mn4+ ratio determined by the Sr fraction (x), it was found that a presence of intensity on Mn 2p3/2 spectra other than the above. The peak was identified as the well-screened peak from the Mn4+ sites, consequently the sum of the well-screened weight of the Mn3+ sites and Mn4+ sites was related to the electrical conductivity with x.