Introduction to XPS Analysis for Beginners
Released on J-STAGE: September 01, 2020 | Volume 26 Issue 1 Pages 41-48
Masahide Shima
Views: 658
The handling of numeric data - from "round off" to "detection limit"-I. How to round the numeric data, and the base of error
Released on J-STAGE: September 07, 2011 | Volume 17 Issue 1 Pages 28-36
Sei Fukushima
Views: 435
Introduction to TOF-SIMS Analysis for Beginners
Released on J-STAGE: September 01, 2020 | Volume 26 Issue 1 Pages 49-55
Hiroto Itoh
Views: 365
Measurement of Silicon Oxide Film Thickness by X-ray Photoelectron Spectroscopy with ISO 14701
Released on J-STAGE: December 18, 2022 | Volume 28 Issue 3 Pages 173-178
Yasuo Yamauchi, Shoya Oizumi, Satoka Ohnishi
Views: 267
Introduction of Cluster Analysis
Released on J-STAGE: September 01, 2019 | Volume 21 Issue 1 Pages 10-17
Kazuhiro Yoshihara, Heizo Tokutaka
Views: 256
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