KENBIKYO

KENBIKYO

Published by The Japanese Society of Microscopy

906 registered articles
(updated on May 08, 2026)

Online ISSN : 2434-2386
Print ISSN : 1349-0958

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2025 Volume 60 Issue 3

Advances in Measurement Technology Based on Illumination Beam Control in Electron Microscopes Jun Yamasaki
Technological Advances and Imaging Methods in Volume Electron Microscopy for Neural Circuit Analysis Yoshiyuki Kubota, Takaaki Miyazaki, Nilton L Kamiji, Jaerin Sohn, Mitsuo Suga
Ultrafast Electron Diffraction and Microscopy Using Radio-Frequency Accelerating Technology Jinfeng Yang
Development of Spin-Polarized Pulsed Electron Source for Electron Microscopy Makoto Kuwahara

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Most viewed articles (April 2026)

1

Staining and Its Precautions for Soft Materials

Released on J-STAGE: May 25, 2022 | Volume 57 Issue 1 Pages 3-7

Mami Konomi, Hiroshi Jinnai
2

Detection Limit of TEM/STEM-EDS

Released on J-STAGE: August 01, 2019 | Volume 53 Issue 3 Pages 134-139

Kei-ichi Fukunaga, Yukihito Kondo
3

Low-dose Atomic-resolution Imaging Using OBF STEM

Released on J-STAGE: September 07, 2022 | Volume 57 Issue 2 Pages 49-53

Kousuke Ooe, Takehito Seki, Yuji Kohno, Akiho Nakamura, Yuichi Ikuhara, Naoya Shibata
4

Current State and Future Prospects of High-Speed AFM

Released on J-STAGE: September 07, 2019 | Volume 54 Issue 2 Pages 56-61

Toshio Ando
5

Electron Tomography, Its Principles and Elements

Released on J-STAGE: January 21, 2020 | Volume 45 Issue 1 Pages 37-41

Kenji Kaneko, Norio Baba, Hiroshi Jinnai

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