Staining and Its Precautions for Soft Materials
Released on J-STAGE: May 25, 2022 | Volume 57 Issue 1 Pages 3-7
Mami Konomi, Hiroshi Jinnai
Methods and Reference Materials for the Image Resolution Evaluation in SEM
Released on J-STAGE: May 25, 2022 | Volume 57 Issue 1 Pages 23-30
Kazuhiro Kumagai, Akira Kurokawa
Detection Limit of TEM/STEM-EDS
Released on J-STAGE: August 01, 2019 | Volume 53 Issue 3 Pages 134-139
Kei-ichi Fukunaga, Yukihito Kondo
Principles of High Resolution STEM Images (I)
Released on J-STAGE: January 29, 2020 | Volume 43 Issue 2 Pages 125-129
Takashi Yamazaki, Kazuto Watanabe
Deformation of Embedding Resin by Electron Beam Damage
Released on J-STAGE: May 25, 2022 | Volume 57 Issue 1 Pages 13-17
Keisuke Ohta, Akinobu Togo
Denshi kenbikyo
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