Reports of the Technical Conference of the Institute of Image Electronics Engineers of Japan

Reports of the Technical Conference of the Institute of Image Electronics Engineers of Japan

Published by The Institute of Image Electronics Engineers of Japan

2,541 registered articles
(updated on July 23, 2025)

Online ISSN : 2758-9218
Print ISSN : 0285-3957

CONFERENCE PROCEEDINGS RESTRICTED ACCESS

Reports of the 309th Technical Conference of the Institute of Image Electronics Engineers of Japan

An Experiment to Find the Cause of Information System Errors Using Image Captioning AI Akio FUJIOKA, Shungo KIMURA, Rin YAMAKU, Miki SHIRANE, Kazuyuki ISO, Masao AKINO, Keiko TOMIZAWA, Sakura YAMADA, Yu HORIUCHI, Hitomi AINOURA, Eiji TAKAHASHI
Utilizing 3D CG-based Reverse Projection Photogrammetry for Gait-based Verification Analysis Daisuke IMOTO, Masato ASANO, Wataru SAKURAI, Masakatsu HONMA, Kenji KUROSAWA
A Study on Recognition of Commands of Electronic Devices by Mouth Shape Using Machine Learning Ryotaro TANAKA, Yue BAO
System Simulation Described by Differential Equations through Python Kunio OHNO

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1

A Prototype System of Character Recognition on Electronic Substrates for Efficient Recycling

Released on J-STAGE: July 31, 2023 | Reports of the 301st Technical Conference of the Institute of Image Electronics Engineers of Japan 22-01-05

* Shunto NARITA, Tomonori IZUMI
2

Imagraph

Released on J-STAGE: March 31, 2023 | Reports of the 298th Technical Conference of the Institute of Image Electronics Engineers of Japan 21-02-06

* Goki MURAMOTO
3

Peripheral Blood Leukocyte Classification CNN Model for Dogs and Cats by ResNet

Released on J-STAGE: June 30, 2025 | Reports of the 308th Technical Conference of the Institute of Image Electronics Engineers of Japan 23-04-092

* Koki SHIMABUKURO, Tomokazu ISHIKAWA
3

New approach for detecting counterfeited 2D symbol generated by industrial inkjet printer

Released on J-STAGE: March 31, 2023 | Reports of the 299th Technical Conference of the Institute of Image Electronics Engineers of Japan 21-03-25

* Ami HOSAKA, Kitahiro KANEDA, Keiichi IWAMURA
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Study of Defect Verification based on Histogram of Oriented Gradients in Local Area

Released on J-STAGE: March 31, 2019 | Reports of the 264th Technical Conference of the Institute of Image Electronics Engineers of Japan 12-03-01

* Yoshiharu Nakamura, Masahiro Masuzoe, Shuichi Enokida

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