Host: The Japan Society of Vacuum and Surface Science
A notable advantage of frequency modulation atomic force microscopy (FM-AFM) is an ability to measure the conservative and dissipative tip-sample interactions in two separate signals, resonance frequency shift and excitation signal amplitude (often called “dissipation signal”), independently. The dissipation signal can be used as a resource for acquiring an additional information, particularly electric force. We have shown that the exploitation of dissipation signal enables quantitative electronic level spectroscopy of individual quantum dots and vibronic excitation of single molecules. We have also used the dissipation signal for realizing Kelvin probe force microscopy that requires much smaller ac modulation amplitude than the conventional implementations. In this presentation, I will discuss the signal generation mechanism of dissipation signal and several technical requirements for the measurements based on the dissipation signal. I will then present the overview of the applications listed above.
