IEICE Transactions on Communications
Online ISSN : 1745-1345
Print ISSN : 0916-8516
Special Section on Advanced Electromagnetic Compatibility Technology in Conjunction with Main Topics of EMC'09/Kyoto
A Simulation-Based Black-Box Microcontroller Model for EME Prediction
Yamarita VILLAVICENCIOFrancesco MUSOLINOFranco FIORI
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2010 Volume E93.B Issue 7 Pages 1715-1722

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Abstract
This paper describes a black-box model of mixed analog-digital VLSI circuits for the prediction of microcontroller electromagnetic emissions without disclosure of manufacturer data. The model is based on small-signal simulations performed at the analog and digital building-block level, considering also layout and technology parameters, and modeling the parasitic substrate coupling paths and the interconnects. The developed model allows system designers to predict the impact of microcontroller operation on the system-level EMEs by carrying out low-time consuming simulations in the early design phases of their products thus minimizing unnecessary costs and scheduling delays. In this paper, the black-box model of an 8-bit microcontroller is described and it is employed to predict the conducted emission delivered through the input-output ports.
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© 2010 The Institute of Electronics, Information and Communication Engineers
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