FE-SEM observation on the interfacial ultrastructure of an improved two-bottle/one-step type resin bonding

Abstract

The One-Up Bond F, which is one-step self etching adhesive manufuctured by Tokuyama Dental Co. Ltd., has fluoride releasing property and a novel characteristic of the color change due to the polymerization during light-irradiation. This system has been widely used in our routine clinic. Recently, the One-Up Bond F Bonding has been improved for the shorter application time. The purpose of this study was to examine the interfacial ultrastructure of the improved One-Up Bond F (One-Up Bond F Plus) under the FE-SEM by means of the Ar-ion beam etching technique. The Palfique Estelite LV was bonded to the enamel/intact dentin cavities or the dentin cavities after caries removal of the human extracted molars using this system. In a routine technique, the specimens were cut half, embedded in an epoxy resin, polished and then the resin-tooth interface was observed after Ar-ion beam etching for 35 sec under the FE-SEM. The One-Up Bond F Plus showed a tight interfacial junction to enamel/intact dentin/caries-affected dentin. The hybrid layer of the width of 0.5μm was observed in the superficial dentin layer. From the results of this study, it was suggested that this resin bonding system of which the application time was shortened might be promising for clinical use.