2019 Volume 55 Issue 7 Pages 278-284
Infrared（IR）spectroscopy has been a powerful tool for chemical structural analysis of adhesive interfaces thanks to its high sensitivity to polar functional groups. However, its spatial resolution is limited to a few micrometers at most by diffraction limit. Recently, combination of AFM with IR laser sources develops several kinds of IR spectroscopy with nanometer spatial resolution. Among them, AFM-IR which detects IR absorption through photothermal expansion of a sample has been used widely in both academic and industrial fields. The principle of AFM-IR and its applications to interfacial analyses are introduced.
