Proceedings of Annual / Fall Meetings of Atomic Energy Society of Japan
2006 Fall Meeting
Session ID : N01
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Transient void behavior in simulation tests for cold shutdown reactivity initiated accidents with bundle geometry
*Akira Satou, Yu Maruyama, Hideaki Asaka, Hideo Nakamura
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Keywords: Reactivity initiated accidents, Transient void behavior, Bundle geometry, Impedance technique
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[in Japanese]
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© 2006 Atomic Energy Society of Japan
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