Host: The Institute of Image Electronics Engineers of Japan
Name : Proceedings of the44th Annual Conference of the Institute of Image Electronics Engineers of Japan 2016
Number : 44
Location : [in Japanese]
Date : June 18, 2016 - June 19, 2016
In regression testing, it takes much costs to check whether screens are displayed normally. In the conventional way, Bit map checks are used. Then, we have to check the screens displayed abnormally.We propose a method on extraction of different pixels and show the results of the evaluation.