AIJ Journal of Technology and Design
Online ISSN : 1881-8188
Print ISSN : 1341-9463
ISSN-L : 1341-9463
Information Systems Technology
A METHOD FOR IMPROVING THE ACCURACY OF SFM 3D MEASUREMENTS BY RANDOM PATTERN PROJECTION
Miki SUGANOKen’ichi KAKIZAKIYasumasa TOMINAGAShunsuke ARAKI
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2023 Volume 29 Issue 71 Pages 533-537

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Abstract

SfM can reconstruct the 3D shape of an object with high accuracy if there are many feature points on the surface to be measured. However, in the field of architecture, there is a problem that building surfaces are beautifully preserved and the shape cannot be reconstructed because of the small number of feature points. In this study, we proposed a method to improve the measurement accuracy of SfM by projecting a random pattern on a wall surface and distributing a large number of feature points. Experiments confirmed that the measurement accuracy was as good as that of a laser scanner.

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© 2023, Architectural Institute of Japan
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