Characterization of Metal Oxide Surfaces and Thin Semiconductor Films by Inelastic Electron Tunneling Spectroscopy

Abstract

Inelastic electron tunneling spectroscopy (IETS) is a unique surface and interface analytical technique using electron tunneling through a metal/insulator/metal tunneling junction at cryogenic temperatures. It gives the vibrational spectrum of a very thin (nm) insulator film and the adsorbed species on it. The high sensitivity, good resolution, and wide spectral range inherent in IETS enable us to analyze the surface and interface of the insulator in detail. The tunneling junction is a good model system for oxide catalysts, electronic devises, and solid state sensors. Information about the surfaces of alumina and magnesia, the adsorption states and chemical reactions of adsorbed species occurring on these oxides can be obtained through an analysis of the tunneling spectra. The structures and properties of evaporated thin semiconductor films can also be studied. In this review, the surface characterization of alumina and magnesia, the adsorption and surface reactions of organic acids, esters, amides, and nitryls on these oxides, and the characterization of thin evaporated films of Si, Ge, and the oxides are summarized.