Analytical Sciences
Online ISSN : 1348-2246
Print ISSN : 0910-6340
ISSN-L : 0910-6340
Original Papers
Electron Spectra Line Shape Analysis of Highly Oriented Pyrolytic Graphite and Nanocrystalline Diamond
Beata LESIAKJosef ZEMEKJana HOUDKOVAAlexander KROMKAAdam JÓZWIK
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JOURNALS FREE ACCESS

2010 Volume 26 Issue 2 Pages 217-222

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Abstract

The X-ray excited Auger electron spectroscopy (XAES), X-ray photoelectron spectroscopy (XPS) and elastic peak electron spectroscopy (EPES) methods were applied in investigating samples of nanocrystalline diamond and highly oriented pyrolytic graphite of various C sp2/sp3 ratios, crystallinity conditions and grain sizes. The composition at the surface was estimated from the XPS. The C sp2/sp3 ratio was evaluated from the width of the XAES first derivative C KLL spectra and from fitting of XPS C 1s spectra into components. The pattern recognition (PR) method applied for analyzing the spectra line shapes exhibited high accuracy in distinguishing different carbon materials. The PR method was found to be a potentially useful approach for identification, especially important for technological applications in fields of materials engineering and for controlling the chemical reaction products during synthesis.

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© 2010 by The Japan Society for Analytical Chemistry
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