Analytical Sciences
Online ISSN : 1348-2246
Print ISSN : 0910-6340
ISSN-L : 0910-6340

This article has now been updated. Please use the final version.

Recent progresses in nanometer scale analysis of buried layers and interfaces in thin films by X-rays and neutrons
Krassimir Stoev, Kenji Sakurai
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JOURNAL FREE ACCESS Advance online publication

Article ID: 19R010

The final version of this article is now available: Vol. 36 (2020), No. 8 pp. 901-922
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