Abstract
A modified gas jet-enhanced sputtering device was investigated in atomic spectrometry for the analysis of solid samples. Comparisons of the calibration curve and analytical performance were made between three types of jet cofigurations. These included a six-jet configuration, a cone jet configuration, and a cylinder-jet configuration. The absorbance of Ni (232.0nm), Mn (279.5nm), Cr (357.9nm), Cu (324.7nm), Si (251.6nm) sputtered from iron and the absorbance of Ni (232.0nm) sputtered from aluminum, brass and iron were studied. The cone jet configuration showed the highest sensitivity. Sensitivities of 1% absorption for Cu, Cr, Ni, Mn, and Si, determined in the low-alloy steel under the optimum conditions, were 81, 20, 49, 57, and 79μg/g with cone-jet configuration, respectively.
