The Characterization and Use Of Intrinsic Background In Xps

Analytical Sciences/Supplements

Proceedings of IUPAC International Congress on Analytical Sciences 2001 (ICAS 2001)

DOI https://doi.org/10.14891/analscisp.17icas.0.i147.0

会議情報

S-05 New phase in X-ray analysis from super soft to super hard X-rays

The Characterization and Use Of Intrinsic Background In Xps

James E. CASTLE, Anna M. SALVI

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会議録・要旨集フリー

p. i147-i150

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© 2002 2001 by The Japan Society for Analytical Chemistry

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