蛍光X線分析用分光結晶の熱膨脹と温度制御
1968 年 16 巻 4 号 p. 158-161
詳細
1968 年 16 巻 4 号 p. 158-161
The angular shift caused by thermal expansion of analyzing crystal seriously affects the accuracy in the quantitative measurement of special X-ray fluorescence analysis such as the determination of coordination number of alminium.It is necessary to keep the variation of temperature of analyzing crystal within a certain limit during the experiment, so that the angular shift by the temperature variation can be neglected.For this purpose, the attachment for controlling the temperature of analyzing crystal was divised.The analyzing crystal was immediately heated by a manganin heater and temperature of the crystal was controlled within±0.3°C by means of a commercially available temperature controller.
Using the temperature control attachment the thermal expansion coefficients of analyzing crystal, EDDT and ADP, were measured from the change of diffraction angle for Al Ka and Mg Kα spectral lines with temperature. The mean thermal expansion coefficients αEDDT (020) and αADP (101) in the range between 20°C and 40°C were 18×10-6 and 14×10-6 respectively.The error in the measurement of diffraction angle (2θ) was less than±0.002°C.
