Butsuri
Online ISSN : 2423-8872
Print ISSN : 0029-0181
ISSN-L : 0029-0181
Highly-Charged-Ion Study with Electron-Beam-Ion-Trap : Precise Spectroscopic Experiments of Cold Trapped Highly Charged Ions and Their Collision Experiments with Solid Surfaces
Daiji KatoShunsuke Ohtani
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2002 Volume 57 Issue 12 Pages 890-899

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Abstract

Due to recent development of the Electron-Beam-Ion-Trap (EBIT), highly-charged-ion (HCI) studies are entering a new phase : Firstly, precision-spectroscopic investigations on relativistic and quantum-electrodynamical effects in atomic systems and related phenomena to nuclear structures become feasible by observing cold trapped HCIs. Secondly, by using slow HCIs extracted from the EBIT, collision experiments with solid surfaces are being conducted to study secondary particle emissions and nano-scale-structural changes on the surface layer of non-metals caused by the deposition of huge internal potential-energy of HCIs. In this report, some selected recent activities are reviewed.

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© The Physical Society of Japan
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