Experimental platform for Ethernet communication failures caused by conducted noise from power conversion circuits

抄録

This paper proposes a platform for electromagnetic interference on Ethernet communication devices due to conducted noise from power conversion circuits, focusing on the electromagnetic near-field coupling between the DC bus and the communication line. The waveforms measured on the platform during switching transients reveal the mechanism of communication failure. The Ethernet performance evaluation by a network protocol analyzer shows that the converter switching frequency impacts the communication error rate.